Description
The Hitachi S-4700 is a cold field emission scanning electron microscope (Cold FEG-SEM), capable of high resolution imaging and specimen topography studies in the range of mm to nm. Under optimal working conditions, it can magnify images upwards of 500,000 times and resolve features down to 1.5 nm. The cold FE gun produces high brightness with little energy spread and typically has a longer lifetime than a Schottky emitter.
