Philips XL30 Tungsten Filament SEM with Point Electronics Upgrade

Microscope specifications:

Age: Circa 1994
Resolution: 3.5 nm at 30 kV
Accelerating Voltage: 0.5 to 30 kV
Specimen Stage: 4-axis motorised eucentric at all WDs
Imaging Modes: SE
OS: Windows 10
External Detectors: None
Price: Available on request

 

SKU: 00001-3 Categories: , Tag:

Reviews

There are no reviews yet.

Be the first to review “Philips XL30 Tungsten Filament SEM with Point Electronics Upgrade”

Your email address will not be published. Required fields are marked *