Philips XL30 Tungsten Filament SEM with Point Electronics Upgrade

Microscope specifications:

Age: Circa 1994
Resolution: 3.5 nm at 30 kV
Accelerating Voltage: 0.5 to 30 kV
Specimen Stage: 4-axis motorised eucentric at all WDs
Imaging Modes: SE
OS: Windows 10
External Detectors: None
Price: Available on request

Request Quote

Request A Quote:
SKU: 00001-3 Categories: , Tag: