Philips XL30 Tungsten Filament SEM with Point Electronics Upgrade

(1 customer review)

Microscope specifications:

Age: Circa 1994
Resolution: 3.5 nm at 30 kV
Accelerating Voltage: 0.5 to 30 kV
Specimen Stage: 4-axis motorised eucentric at all WDs
Imaging Modes: SE
OS: Windows 10
External Detectors: None
Price: Available on request

 

SKU: 00001-3 Categories: , Tag:

1 review for Philips XL30 Tungsten Filament SEM with Point Electronics Upgrade

  1. rwqfthhwbs

    Muchas gracias. ?Como puedo iniciar sesion?

    • Dan Barry

      Thankyou for your interest in this system! You can reach us either via the Contact Us page, or by email at sales@iss-group.co.uk, and we will be happy to assist you.

Add a review

Your email address will not be published. Required fields are marked *