JEOL JSM 7001F Schottky Emission SEM
Microscope Specifications
Age: 2011
Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV
Accelerating Voltage: 0.5 to 30 kV
Specimen Stage: Mechanically eucentric at all WDs
Imaging modes: SE, BEI to E/T detector
OS: Windows 10
External Detectors: None
Price: Available on request
